Combined scanning electrochemical-atomic force microscopy.

  title={Combined scanning electrochemical-atomic force microscopy.},
  author={Julie V Macpherson and Patrick R Unwin},
  journal={Analytical chemistry},
  volume={72 2},
A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while… CONTINUE READING
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