Combined atomic force and scanning reflection interference contrast microscopy

@inproceedings{Hillner2006CombinedAF,
  title={Combined atomic force and scanning reflection interference contrast microscopy},
  author={P. E. Hillner and Manfred Radmacher and Paul K. Hansma},
  year={2006}
}
Abstract : A sphere attached to a cantilever is used simultaneously as an atomic force microscope (AFM) tip and as a curved reflective surface for producing scanning reflection interference contrast microscope (RICM) images of fluorescent beads dried onto a glass slide. The AFM and RICM images are acquired in direct registration which enables the identification of individually excited beads in the AFM images. The addition of a sharp, electron beam-deposited tip to the sphere gives nanometer… CONTINUE READING