Combinational test generation using satisfiability

@article{Stephan1996CombinationalTG,
  title={Combinational test generation using satisfiability},
  author={Paul R. Stephan and Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1996},
  volume={15},
  pages={1167-1176}
}
We present a robust and efficient algorithm for combinational test generation using a reduction to satisfiability (SAT). The algorithm, TEGUS, has the following features. We choose a form for the test set characteristic equation which minimizes its size. The simplified equation is solved by an algorithm for SAT using simple, but powerful, greedy heuristics… CONTINUE READING

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