Combinational ATPG theorems for identifying untestable faults in sequential circuits

@article{Agrawal1995CombinationalAT,
  title={Combinational ATPG theorems for identifying untestable faults in sequential circuits},
  author={Vishwani D. Agrawal and Srimat T. Chakradhar},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1995},
  volume={14},
  pages={1155-1160}
}
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