Column-Parallel Digital Correlated Multiple Sampling for Low-Noise CMOS Image Sensors

@article{Chen2012ColumnParallelDC,
  title={Column-Parallel Digital Correlated Multiple Sampling for Low-Noise CMOS Image Sensors},
  author={Yue Chen and Yang Xu and A. J. Mierop and A. J. P. Theuwissen},
  journal={IEEE Sensors Journal},
  year={2012},
  volume={12},
  pages={793-799}
}
This paper presents a low-noise CMOS image sensor using column-parallel high-gain signal readout and digital correlated multiple sampling (CMS). The sensor used is a conventional 4T active pixel with a pinned-photodiode as detector. The test sensor has been fabricated in a 0.18 μm CMOS image sensor process from TSMC. The random noise from the pixel readout chain is reduced in two stages, first using a high gain column parallel amplifier and second by using the digital CMS technique. The dark… CONTINUE READING
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References

Publications referenced by this paper.
Showing 1-10 of 23 references

A dual-conversion-gain video sensor with dewarping and overlay on a single chip

2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers • 2009
View 10 Excerpts
Highly Influenced

A temporal noise 1/3.2-inch 8 Mpixel CMOS image sensor using pseudo-multiple sampling

Y. Lim
Proc. ISSCC Dig. Tech. Papers, San Francisco, CA, Feb. 2010, pp. 396–397. • 2010
View 4 Excerpts
Highly Influenced

An 80 temporal noise 82 dB dynamic range CMOS image sensor with a 13–19 b variable-resolution column-parallel folding-integration/cyclic ADC

M.-W. Seo
Proc. ISSCC Dig. Tech. Papers, San Francisco, CA, Feb. 2011, pp. 400–402. • 2011
View 1 Excerpt

A 2.1Mpixel 120frame/s CMOS image sensor with column-parallel ΔΣ ADC architecture

2010 IEEE International Solid-State Circuits Conference - (ISSCC) • 2010

A vertical FPN read noise 71 dB DR CMOS image sensor with 13 b column-parallel single-ended cyclic ADCs

J.-H. Park
Proc. ISSCC Dig. Tech. Papers, San Francisco, CA, Feb. 2009, pp. 268–269. • 2009

A 1/2.7 inch Low-Noise CMOS Image Sensor for Full HD Camcorders

2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers • 2007

Analog signal processing for CMOS image sensors

M. Snoeij
Ph.D. dissertation, Delft Univ. Technol., Delft, The Netherlands, 2007. • 2007
View 1 Excerpt

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