Column-Matching BIST Exploiting Test Don ' t-Cares

  title={Column-Matching BIST Exploiting Test Don ' t-Cares},
  author={Petr Fiser and Jan Hlavi and Hana Kubatova},
We propose a new test-per-clock BIST method for com binational or full-scan circuits. Our aim is to des ign a combinational block transforming the LFSR code word s into deterministic test patterns pre-computed by some ATPG tool. The proposed algorithm is an enhancement of a colum n matching method, in which the maximum of the outp ut variables of the decoder is tried to be implemented as mere wire s, thus without any logic. The enhancement consists in extending the use of the method for a test… CONTINUE READING

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