Clustering-Based Production-Line Binning of ICs Based on I DDQ

  title={Clustering-Based Production-Line Binning of ICs Based on I DDQ},
  author={Ritesh P. Turakhia and Anura P. Jayasumana},
A clustering-based technique is proposed for production line testing and real time binning of ICs. This paper presents a two-phase approach. The first phase involves off-line clustering and cluster characterization based on prior data. In the second phase, each device is sorted based on its quality attributes, into bins associated with specific quality and cost parameters. This allows fast real-time sorting of ICs on production line use of IDDQ test methodology. Use of clustering algorithm… CONTINUE READING