Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy

@article{Battaglia2009ClusterIW,
  title={Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy},
  author={M. Battaglia and D. Contarato and P. Denes and P. Giubilato},
  journal={Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment},
  year={2009},
  volume={608},
  pages={363-365}
}
  • M. Battaglia, D. Contarato, +1 author P. Giubilato
  • Published 2009
  • Physics
  • Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
  • Abstract A cluster imaging technique for Transmission Electron Microscopy with a direct detection CMOS pixel sensor is presented. Charge centre-of-gravity reconstruction for individual electron clusters improves the spatial resolution and thus the point spread function. Data collected with a CMOS sensor with 9.5 × 9.5 μ m 2 pixels show an improvement of a factor of two in point spread function to 2.7 μ m at 300 keV and of a factor of three in the image contrast, compared to traditional bright… CONTINUE READING
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