Closed-Form Expressions for I/O Simultaneous Switching Noise Revisited

@article{Wang2017ClosedFormEF,
  title={Closed-Form Expressions for I/O Simultaneous Switching Noise Revisited},
  author={Hailang Wang and Emre Salman},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2017},
  volume={25},
  pages={769-773}
}
Closed-form expressions to estimate power supply noise due to the simultaneous switching of I/O drivers are revisited in this brief. It is shown that existing closed-form expressions share a common limitation and underestimate noise with up to 83% error in advanced nanoscale technologies with fast signal rise/fall times. This characteristic is investigated, both quantitatively and qualitatively. New closed-form expressions are developed for the signals with fast transition times. Results… CONTINUE READING
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