Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests

@inproceedings{Gharaybeh1995ClassificationAT,
  title={Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests},
  author={Marwan A. Gharaybeh and Michael L. Bushnell and Vishwani D. Agrawal},
  booktitle={ITC},
  year={1995}
}

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