Circularscan: a scan architecture for test cost reduction

  title={Circularscan: a scan architecture for test cost reduction},
  author={Baris Arslan and Alex Orailoglu},
  journal={Proceedings Design, Automation and Test in Europe Conference and Exhibition},
  pages={1290-1295 Vol.2}
Scan-based designs are widely used to decrease the complexity of the test generation process; nonetheless, they increase test time and volume. A new scan architecture is proposed to reduce test time and volume while retaining the original scan input count. Theproposed architecture allows the use of the captured response as a template for the next pattern with only the necessary bits of the captured response being updated while observing the full captured response. The theoretical and… CONTINUE READING
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