Circular BIST with state skipping

  title={Circular BIST with state skipping},
  author={Nur A. Touba},
  journal={IEEE Trans. VLSI Syst.},
Circular built-in self-test (BIST) is a “test per clock” scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion. However, it has seen limited use because it does not reliably provide high fault coverage. This paper presents a systematic approach for achieving high fault coverage with circular BIST. The basic idea is to add a small amount of logic that causes the circular chain to skip to particular… CONTINUE READING


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