Corpus ID: 208047934

Circuits for Pseudo-Exhaustive Test Pattern Generation.

@inproceedings{Wang1986CircuitsFP,
  title={Circuits for Pseudo-Exhaustive Test Pattern Generation.},
  author={Laung-Terng Wang and Edward J. McCluskey},
  year={1986}
}
  • Laung-Terng Wang, Edward J. McCluskey
  • Published 1986
  • Computer Science
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