Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

@article{Lambrecht2017CircuitMO,
  title={Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits},
  author={Niels Lambrecht and Danix00EBl De Zutter and Dries Vande Ginste and Hugo Pues},
  journal={2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)},
  year={2017},
  pages={141-145}
}
In this paper, we develop a circuit model for the ISO 10605 field coupled ESD test setup. Here, the model is applied to a wire harness consisting of three wires and the device-under-test is a pressure sensor chip designed for use in the automotive industry, allowing to illustrate and validate the proposed circuit model for the ISO 10605 field coupled ESD test on a real application.