Circuit-level modeling of soft errors in integrated circuits

  title={Circuit-level modeling of soft errors in integrated circuits},
  author={S. Walstra and Changhong Dai},
  journal={IEEE Transactions on Device and Materials Reliability},
This paper describes the steps necessary to develop a soft-error methodology that can be used at the circuit-simulation level for accurate nominal soft-error prediction. It addresses the role of device simulations, statistical simulation, analytical soft-error rate (SER) model development, and SER-model calibration. The resulting approach is easily automated and generic enough to be applied to any type of circuit for estimation of the nominal SER. 
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