Chlorine effect on ion migration for PCBs under temperature-humidity bias test

@inproceedings{Huh2015ChlorineEO,
  title={Chlorine effect on ion migration for PCBs under temperature-humidity bias test},
  author={Seok-Hwan Huh and An-Seob Shin},
  year={2015}
}
A bstract By the trends of electronic package to be more integrative, the fine Cu trace pitch of organic PCB is required to be a robust design. In this study, the short circuit failure mechanism of PCB with a Cl element under the Temperature humidity bias test (85°C/85%RH/3.5V) was examined by micro-structural study. A focused ion beam (FIB) and an electron probe micro analysis (EPMA) were used to polish the cross sections to reveal details of the microstructure of the failure mode. It is found… CONTINUE READING

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