Charge storage in Co nanoclusters embedded in SiO 2 by scanning force microscopy

Scanning force microscopy was used to study localized charge deposition and subsequent transport in Co nanoclusters embedded in SiO 2 deposited on an-type Si substrate. Co nanoclusters were charged by applying a bias voltage pulse between tip and sample, and electrostatic force microscopy was used to image charged areas, to determine quantitatively the… (More)