Charge-injection noise in CCDs

  title={Charge-injection noise in CCDs},
  author={Brian D. Kern},
  journal={IEEE Transactions on Electron Devices},
  • Brian D. Kern
  • Published 2006 in IEEE Transactions on Electron Devices
An analysis of the noise associated with electronic charge injection in charge-coupled devices (CCDs) is presented, including the effects of diffusion currents. The capacitance of the injection circuit determines the charge-injection noise, and specification of the noise requires consideration of the quoted capacitance; for large charge packets, the noise has a characteristic variance of kTC/2 or kTC, depending on whether the capacitance is defined by microscopic (internal) or macroscopic… CONTINUE READING

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