Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications.

@article{Bradley1998ChargeCA,
  title={Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications.},
  author={Peter Douglas Bradley and Anatoly B. Rosenfeld and Kee Keun Lee and David N. Jamieson and Gernot Heiser and Suzuko Satoh},
  journal={IEEE transactions on nuclear science},
  year={1998},
  volume={45 6},
  pages={
          2700-10
        }
}
The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection. 

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