• DOI:10.1093/ptep/ptac023
• Corpus ID: 238253150

Characterization of two-level system noise for microwave kinetic inductance detector comprising niobium film on silicon substrate

@inproceedings{Sueno2021CharacterizationOT,
  title={Characterization of two-level system noise for microwave kinetic inductance detector comprising niobium film on silicon substrate},
  author={Y. Sueno and Shunsuke Honda and H. Kutsuma and Satoru Mima and Chiko Otani and Shugo Oguri and Junya Suzuki and Osamu Tajima},
  year={2021}
}

• Y. Sueno, S. Honda, +5 authors O. Tajima
• Published 30 September 2021
• Physics

Y. Sueno1, S. Honda2, H. Kutsuma3, S. Mima4, C. Otani5, S. Oguri6, J. Suzuki1, and O. Tajima1 1Department of Physics, Graduate School of Science, Kyoto University, Kitashirakawa-Oiwakecho, Sakyo-ku, Kyoto 606-8502, Japan ∗E-mail: [e-mail] 2Instituto de Astrofisica de Canarias Calle Vı́a Láctea, s/n, 38205 San Cristóbal de La Laguna, Santa Cruz de Tenerife, Spain 3RIKEN Center for Quantum Computing (RQC), RIKEN 2-1 Hirosawa, Wako, Saitama, 351-0198, Japan 4Superconductive ICT Device Laboratory, Kobe Frontier Research Center, Advanced ICT Research Institute, National Institute of Information and Communications Technology 588-2, Iwaoka, Nishi-ku, Kobe, Hyogo, 651-2492, Japan 5Terahertz Sensing and Imaging Research Team, RIKEN 519-1399 Aramaki-Aoba, Aoba-ku, Sendai, 980-0845, Miyagi, Japan 6Institute of Space and Astronautical Science (ISAS), Japan Aerospace Exploration Agency (JAXA) 3-1-1 Yoshinodai, Chuo-ku, Sagamihara, Kanagawa 252-5210, Japan