Characterization of surface topography of wear particles by SEM stereoscopy

@inproceedings{Podsiadlo1997CharacterizationOS,
  title={Characterization of surface topography of wear particles by SEM stereoscopy},
  author={Pawel Podsiadlo and Gwidon W. Stachowiak},
  year={1997}
}
A method of characterizing the surface topography of wear particles by the application of computer image analysis to scanning electron microscope (SEM) stereoscopic pairs of images is proposed and described in this paper. The image analysis consists of noise reduction, edge detection, thresholding, stereoscopic matching, calculation of elevation points and interpolation. An improved automatic stereoscopic matching algorithm has been developed. The algorithm was initially applied to computer… CONTINUE READING

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