Characterization of single-mode chalcogenide glass waveguides at 8.35 µm

Abstract

Laser-written single-mode waveguides in As<inf>2</inf>Se<inf>3</inf>/As<inf>2</inf>S<inf>3</inf> films were characterized at 8.35 µm using the Fabry-Perot technique. Waveguide loss and refractive index were measured as a function of writing dose and compared to modeling results. 

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