Characterization of power electronics system interconnect parasitics using time domain reflectometry

@inproceedings{Zhu1998CharacterizationOP,
  title={Characterization of power electronics system interconnect parasitics using time domain reflectometry},
  author={Huibin Zhu and Allen R. Hefner and Jih-Sheng Lai},
  year={1998}
}
The significance of interconnect parasitics of power electronics systems is their effects on converters’ electromagnetic interference (EMI)-related performances, such as voltage/current spikes, dv=dt; di=dt, conducted/radiated EMI noise, etc. In this paper, a time domain reflectometry (TDR) measurement-based modeling technique is described for characterizing interconnect parasitics in switching power converters. Experiments are conducted on power components of a prototype high-power inverter… CONTINUE READING

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