Characterization of Standard Cells for Intra-Cell Mismatch Variations

@article{Sundareswaran2008CharacterizationOS,
  title={Characterization of Standard Cells for Intra-Cell Mismatch Variations},
  author={Savithri Sundareswaran and Jacob A. Abraham and Alexandre Ardelea and Rajendran Panda},
  journal={9th International Symposium on Quality Electronic Design (isqed 2008)},
  year={2008},
  pages={213-219}
}
With the adoption of statistical timing across industry, there is a need to characterize all gates/cells in a digital library for delay variation (referred to as statistical characterization). Statistical characterization needs to be performed efficiently with acceptable accuracy as a function of several process and environmental parameter variations. In this paper, we propose an approach to consider intra-cell process mismatch variations to characterize a cell's delay and output transition… CONTINUE READING
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