Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1: 1
- A. A. Alkanoo, T.M.S.A. Taya
- El-Agez,
- 2015
Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1:1
- Published 2016
Abstract
Abstract: A homemade spectroscopic ellipsometer is designed indigenously to characterize Si-SiO2 sample and two Poly (9-vinylcarbazole) (PVK) films. In the constructed ellipsometer, the polarizer and analyzer rotate in the same direction with the same angular speed. The ellipsometric parameters ψ and Δ are measured as a function of the wavelength for the… (More)