Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1:1

Abstract

Abstract: A homemade spectroscopic ellipsometer is designed indigenously to characterize Si-SiO2 sample and two Poly (9-vinylcarbazole) (PVK) films. In the constructed ellipsometer, the polarizer and analyzer rotate in the same direction with the same angular speed. The ellipsometric parameters ψ and Δ are measured as a function of the wavelength for the… (More)

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