• DOI:10.1007/S11051-010-0091-3
Corpus ID: 18080100

Characterization of English ivy (Hedera helix) adhesion force and imaging using atomic force microscopy

@article{Xia2011CharacterizationOE,
  title={Characterization of English ivy (Hedera helix) adhesion force and imaging using atomic force microscopy},
  author={Lijin Xia and S. Lenaghan and Mingjun Zhang and Yu Wu and X. Zhao and J. Burris and C. N. Neal Stewart},
  journal={Journal of Nanoparticle Research},
  year={2011},
  volume={13},
  pages={1029-1037}
}

Lijin Xia, S. Lenaghan, +4 authors C. N. Neal Stewart

Published 2011

Materials Science

Journal of Nanoparticle Research

English ivy (Hedera helix) is well known for its ability to climb onto and strongly adhere to a variety of solid substrates. It has been discovered that the ivy aerial rootlet secretes an adhesive composed of polysaccharide and spherical nanoparticles. This study aims to characterize the mechanical properties of the nanocomposite adhesive using atomic force microscopy (AFM). The adhesive was first imaged by AFM to visualize the nanocomposite. Mechanical properties were then determined at… CONTINUE READING

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