Characterization and mitigation of process variation in digital circuits and systems

Abstract

Process variation threatens to negate a whole generation of scaling in advanced process technologies due to performance and power spreads of greater than 30-50%. Mitigating this impact requires a thorough understanding of the variation sources, magnitudes and spatial components at the device, circuit and architectural levels. This thesis explores the… (More)

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Cite this paper

@inproceedings{Drego2009CharacterizationAM, title={Characterization and mitigation of process variation in digital circuits and systems}, author={Nigel Drego}, year={2009} }