Characterization and integration of polymeric and microdiffraction specimens using a two-dimensional position-sensitive detector

@inproceedings{Larsen1991CharacterizationAI,
  title={Characterization and integration of polymeric and microdiffraction specimens using a two-dimensional position-sensitive detector},
  author={Richard A. Larsen and A. J. Wauchope},
  year={1991}
}
Abstract An automated x-ray diffraction system configured with a two-dimensional position sensitive detector (PSD) was used to characterize both polymeric and microdiffraction specimens. Pinhole collimation and an incident beam monochromator were used for the polymer applications, while dual nickel coated x-ray mirrors were used to focus and monochromatize the x-ray beam for microdiffraction experiments. Radial and azimuthal integration techniques automatically convert the two-dimensional PSD… CONTINUE READING