Characterization and Parameterized Random Generation of Digital Circuits

  • Michael Huttony, Derek Corneily
  • Published 1999


Abstract The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the architectures and their automatic placement and routing algorithms. In this paper, we present a method and a tool for generating parameterized and realistic random circuits… (More)


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@inproceedings{Huttony1999CharacterizationAP, title={Characterization and Parameterized Random Generation of Digital Circuits}, author={Michael Huttony and Derek Corneily}, year={1999} }