Characterization and Modeling of 1/$f$ Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides

@article{Baek2011CharacterizationAM,
  title={Characterization and Modeling of 1/\$f\$ Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides},
  author={Rock-Hyun Baek and Chang-Ki Baek and Hyun-Sik Choi and Jeong-Soo Lee and Yun young Yeoh and Kyoung Hwan Yeo and Dong-Won Kim and Kinam Kim and D. M. Kim and Yoon-Ha Jeong},
  journal={IEEE Transactions on Nanotechnology},
  year={2011},
  volume={10},
  pages={417-423}
}
In this paper, the volume trap densities Nt are extracted from gate-all-around silicone-nanowire FETs with different gate oxides, using a cylindrical-coordinate-based flicker noise model developed. For extracting Nt, the drain-current power spectral densities were measured from a large number of identical devices and averaged over, thereby mimicking the spatial distribution of trap sites inducing 1/f curve. Also, effective mobility and threshold voltage were simultaneously extracted with the… CONTINUE READING
10 Extracted Citations
23 Extracted References
Similar Papers

Citing Papers

Publications influenced by this paper.
Showing 1-10 of 10 extracted citations

Referenced Papers

Publications referenced by this paper.
Showing 1-10 of 23 references

Flicker noise in deep submicron nMOS transistors

  • N. Lukyanchikova, N. Garbar, M. Petrichuk, E. Simoen, C. Claeys
  • Solid State Electron., vol. 44, pp. 1239–1245…
  • 2000
Highly Influential
11 Excerpts

A unified model for the flicker noise in metal-oxide semiconductor field-effect transistors

  • K. K. Hung, P. K. Ko, C. Hu, Y. C. Cheng
  • IEEE Trans. Electron Devices, vol. 37, no. 3, pp…
  • 1990
Highly Influential
4 Excerpts

Fringing field effects on electrical resistivity of semiconductor nanowire-metal contacts

  • J. Hu, Y. Liu, C. Z. Ning, R. Dutton, S.-M. Kang
  • Appl. Phys. Lett., vol. 92, 083503, 2008.
  • 2008
1 Excerpt

Similar Papers

Loading similar papers…