Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip.

@article{Chung2005CharacteristicsOF,
  title={Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip.},
  author={Koo-Hyun Chung and Yong-Ha Lee and Dae-Eun Kim},
  journal={Ultramicroscopy},
  year={2005},
  volume={102 2},
  pages={161-71}
}
The wear of an atomic force microscope (AFM) tip is one of the crucial issues in AFM as well as in other probe-based applications. In this work, wear tests under extremely low normal load using an AFM were conducted. Also, in order to understand the nature of silicon tip wear, the wear characteristics of crystal silicon and amorphous silicon oxide layer were investigated by a high-resolution transmission electron microscope (HRTEM). It was found that fracture of the tip readily occurred due to… CONTINUE READING
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