Characteristics of a highly scalable bridge phase change memory

@article{Chen2008CharacteristicsOA,
  title={Characteristics of a highly scalable bridge phase change memory},
  author={Yi-Chou Chen and Yuyu Lin and Shih-Hung Chen and Huai-Yu Cheng and Hsiang-Lan Lung and S{\'e}bastien Raoux and C. T. Rettner and G. W. Burr and C. H. Lam},
  journal={2008 9th International Conference on Solid-State and Integrated-Circuit Technology},
  year={2008},
  pages={909-912}
}
Recent advances of a highly scalable bridge phase change memory cell are presented. To fabricate and characterize highly scaled devices, designs in both the process procedure and the testing algorism are considered extensively. We also compare the characteristics of the devices made from different types of materials. The experimental data reveal the superior scaling properties of the bridge phase change memory in different materials. 

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