Characteristic Impedance Extraction Using Calibration Comparison

@article{Vandenberghe2001CharacteristicIE,
  title={Characteristic Impedance Extraction Using Calibration Comparison},
  author={Servaas Vandenberghe and D. M. M.-P. Schreurs and Geert Carchon and Bart Nauwelaers and Walter de Raedt},
  journal={57th ARFTG Conference Digest},
  year={2001},
  volume={39},
  pages={1-4}
}
A robust line impedance identification method is presented. It determines the characteristic impedance of on-wafer TLR standards measured after an initial off-wafer LRM or TLR calibration. The only assumption made is that the obtained trans-wafer error boxes are a cascade of a symmetric probe related disturbance and a change in reference impedance. The… CONTINUE READING