Combinatorial Approach for Automated Platform Diversity Testing
The product line architectures for diagnostic imaging equipment like CT, MRI and conventional X-Ray have to cope with large variations (in hardware and application functions) combined with a high level of integration between their embedded applications. Therefore a primary goal of these architectures is to avoid monolithic applications while retaining the required integrated behaviour. Furthermore, an easy and independent variation of the constituting components is essential. The product line architecture described in this paper gives one recent example solution to this problem. This example presents a layered, event driven; resource restricted system based on the model view controller pattern. Its technical implementation relies heavily on state of the art desktop (WindowsNT) and component techniques (DCOM). For this architecture orthogonality and (binary) variation have been the key design goals. Several views on this architecture, the conceptual, technical and process models are discussed. In all three views the rationale of the chosen concepts and their relation to the problems indicated above is shown.