Chaotic oscillation-based BIST for CMOS operational amplifier

Abstract

This paper presents chaotic oscillation-based built-in self-test (BIST) for CMOS operational amplifier. The proposed BIST technique is based on the use of designed operational amplifier (op-amp) in the unity gain buffer of discrete time chaotic oscillator as circuit under test (CUT) of BIST. The presented BIST detected faults by using a differentiation of… (More)

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