Channel detection in microscope images of materials using marked point process modeling

@article{Kim2015ChannelDI,
  title={Channel detection in microscope images of materials using marked point process modeling},
  author={Dae-Woo Kim and Mary L. Comer},
  journal={2015 IEEE International Conference on Image Processing (ICIP)},
  year={2015},
  pages={3054-3058}
}
In this paper, using the Marked Point Process (MPP) framework, we propose a new model and method to detect channels in microscope images of materials. The detected channel configuration information is expected to be useful for analyzing materials images in many ways. As one example of the possible usage of this channel information, we propose a method to reduce bridging channel defects in the segmentation of images containing channels. Our experimental results demonstrate that proposed model… CONTINUE READING

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