Corpus ID: 19756315

Challenge-response based secure test wrapper for testing cryptographic circuits

@inproceedings{Das2010ChallengeresponseBS,
  title={Challenge-response based secure test wrapper for testing cryptographic circuits},
  author={A. Das and M. Knezevic and S. Seys and I. Verbauwhede},
  booktitle={ETS 2010},
  year={2010}
}
  • A. Das, M. Knezevic, +1 author I. Verbauwhede
  • Published in ETS 2010
  • Computer Science
  • C ryptographic circuits need special test infrastructure due to the concern of security involved. [...] Key Method This scheme includes the KATAN lightweight block-cipher into IEEE 1500 Standard Test Wrapper and as such provides an extremely compact locking and unlocking mechanism for the standard scan chains. The overhead to include this secure locking/unlocking mechanism is limited to about 9% compared to a standard scan and test wrapper. The main contributions of the paper are full testability, very high…Expand Abstract
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    References

    SHOWING 1-10 OF 33 REFERENCES
    Securing Designs against Scan-Based Side-Channel Attacks
    • 129
    • Highly Influential
    • PDF
    Design for Secure Test - A Case Study on Pipelined Advanced Encryption Standard
    • 8
    Secure Scan: A Design-for-Test Architecture for Crypto Chips
    • B. Yang, K. Wu, R. Karri
    • Engineering, Computer Science
    • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    • 2006
    • 227
    • PDF
    Low Cost Built in Self Test for Public Key Crypto Cores
    • 8
    • PDF
    An Efficient Approach to Develop Secure Scan Tree for Crypto-Hardware
    • 25
    Scan Design and Secure Chip
    • 118
    • PDF
    Test control for secure scan designs
    • 88
    IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores
    • G. Chiu, C. Li
    • Engineering, Computer Science
    • 2008 IEEE International Test Conference
    • 2008
    • 7
    • PDF
    State-dependent changeable scan architecture against scan-based side channel attacks
    • 11
    A Scan-Based Attack Based on Discriminators for AES Cryptosystems
    • 42