Cellular Automata for Weighted Random Pattern Generation

  title={Cellular Automata for Weighted Random Pattern Generation},
  author={Danial J. Neebel and Charles R. Kime},
  journal={IEEE Trans. Computers},
Fault testing random-pattern-resistant circuits requires that BIST (built-in self-test) techniques generate large numbers of pseudorandom patterns. To shorten these long test lengths, this study describes a cellular automata-based method that efficiently generates weighted pseudorandom BIST patterns. This structure, called a weighted cellular automaton (WCA), uses no external weighting logic. The design algorithm MWCARGO combines generation of the necessary weight sets and design of the WCA. In… CONTINUE READING
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