Catastrophic failure and fault-tolerant design of IGBT power electronic converters - an overview

@article{Wu2013CatastrophicFA,
  title={Catastrophic failure and fault-tolerant design of IGBT power electronic converters - an overview},
  author={Rui Ting Wu and Frede Blaabjerg and Huai Wang and Marco Liserre and Francesco Iannuzzo},
  journal={IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society},
  year={2013},
  pages={507-513}
}
Reliability is one of the key issues for the application of Insulated Gate Bipolar Transistors (IGBTs) in power electronic converters. Many efforts have been devoted to the reduction of IGBT wear out failure induced by accumulated degradation and catastrophic failure triggered by single-event overstress. The wear out failure under field operation could be mitigated by scheduled maintenances based on lifetime prediction and condition monitoring. However, the catastrophic failure is difficult to… CONTINUE READING

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