Case study - using stil as test pattern language

@article{Fan2003CaseS,
  title={Case study - using stil as test pattern language},
  author={D. Fan and Steve Roehling and R. Carruth},
  journal={International Test Conference, 2003. Proceedings. ITC 2003.},
  year={2003},
  volume={1},
  pages={811-817}
}
  • D. Fan, Steve Roehling, R. Carruth
  • Published 2003
  • Computer Science
  • International Test Conference, 2003. Proceedings. ITC 2003.
  • This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and… CONTINUE READING

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