Case Study - Using STIL as Test Pattern Language

@inproceedings{Fan2003CaseS,
  title={Case Study - Using STIL as Test Pattern Language},
  author={Daniel Fan and Steve Roehling and Rusty Carruth},
  booktitle={ITC},
  year={2003}
}
This paper describes the implementation of a test pattern language using STIL [l], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user arepresented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and… CONTINUE READING