Calibration of atomic‐force microscope tips

  title={Calibration of atomic‐force microscope tips},
  author={Jeffrey L. Hutter and John Bechhoefer},
  journal={Review of Scientific Instruments},
Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment. 

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