Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

@article{Chen2014CalculatingTS,
  title={Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area},
  author={Shuming Chen and Yankang Du and Biwei Liu and Junrui Qin},
  journal={IEEE Transactions on Nuclear Science},
  year={2014},
  volume={61},
  pages={646-653}
}
Concepts of effective sensitive area and effective SET pulse width are proposed to model the actual sensitive area. Simulation results present that the soft error vulnerabilities got by using the effective sensitive area can be almost an order larger than the ones got by using the normal approach when the ion LET is 30 MeV ·cm2/mg. And heavy-ion experiments are conducted to demonstrate the simulation results. 

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Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation

  • N. N. Mahatme
  • Master of Science Thesis in Electrical…
  • 2011
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