CREST-a current estimator for CMOS circuits

@inproceedings{Najm1988CRESTaCE,
  title={CREST-a current estimator for CMOS circuits},
  author={Farid N. Najm and Richard Burch and Ping Yang and Ibrahim N. Hajj},
  booktitle={ICCAD},
  year={1988}
}
CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to e ciently generate accurate estimates of the expected current waveforms. As originally implemented, CREST was restricted to circuits with no pass transistors and no reconvergent fanout or feedback. This paper extends the approach to circuits containing pass transistors, reconvergent fanout, and feedback, and… CONTINUE READING
Highly Cited
This paper has 28 citations. REVIEW CITATIONS

From This Paper

Topics from this paper.

Citations

Publications citing this paper.
Showing 1-10 of 20 extracted citations

References

Publications referenced by this paper.
Showing 1-6 of 6 references

PREDICT { probabilistic estimation of digital circuit testability,

  • S. C. Seth, L. Pan, V. D. Agrawal
  • IEEE 15th Annual International Symposium on Fault…
  • 1985
2 Excerpts

Design implications of transient induced electromigration failures,

  • J. W. McPherson, P. B. Ghate, P. Lou
  • Report # 03-83-30,
  • 1983
1 Excerpt

Similar Papers

Loading similar papers…