CMOS image sensor with FPN reduction by correlated double sampling in current mode

Abstract

The Active Pixel Sensor (APS) has been the preferred choice for CMOS image sensor topology in the last decades. However, due to process variations, parameter mismatches arise and lead to Fixed-Pattern Noise (FPN), which occurs across the APS array. A common technique to reduce FPN is the use of Correlated Double Sampling (CDS) in voltage mode to reduce the… (More)

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