CHEMICAL FORCE MICROSCOPY

@article{Noy1997CHEMICALFM,
  title={CHEMICAL FORCE MICROSCOPY},
  author={Aleksandr Noy and Dmitri V. Vezenov and Charles M. Lieber},
  journal={Annual Review of Materials Science},
  year={1997},
  volume={27},
  pages={381-421}
}
Atomic force microscopy is an imaging tool used widely in fundamental research, although it has, like other scanned probe microscopies, provided only limited information about the chemical nature of systems studied. Modification of force microscope probe tips by covalent linking of organic monolayers that terminate in well-defined functional groups enables direct probing of molecular interactions and imaging with chemical sensitivity. This new chemical force microscopy technique has been used… Expand
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Abstract Chemically modified atomic force microscopy (AFM) tips were produced by using thiol molecules. A new statistical method which produces information about single chemical bond strength fromExpand
Functional Group Imaging by Chemical Force Microscopy
TLDR
By monitoring the friction between a specifically functionalized tip and sample, one can produce friction images that display predictable contrast and correspond to the spatial distribution of functional groups on the sample surface. Expand
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TLDR
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TLDR
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TLDR
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An atomic force microscope (AFM) operating in the lateral (frictional) force mode (LFM) was used to investigate the pH dependence of kinetic friction between a silicon nitride tip and an oxidizedExpand
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