CDM Tester Properties as Deduced From Waveforms

  title={CDM Tester Properties as Deduced From Waveforms},
  author={Timothy J. Maloney and Nathan Jack},
  journal={IEEE Transactions on Device and Materials Reliability},
Two-pole resistance-inductance-capacitance (RLC) models, matching peak current and charge under the first current peak, are shown to fit charged device model (CDM) waveforms well, as they target features that cause device failure. The effect of oscilloscope filtering on the waveform can also be assessed. RLC properties of ferrites, air sparks, varying dielectric, and other tester elements become clear and point us to a revised CDM test standard. 
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