Built-in self test systems for silicon-based phased arrays

Abstract

Phased array silicon chips with built-in-self-test (BIST) have been demonstrated at X-band and W-band using integrated couplers and on-chip receiver circuitry. In the X-band chip (2-element phased array), a dedicated I/Q receiver is built into the chip, while in the W-band case (self-contained 16-element array), the standard I/Q receiver is used for BIST… (More)

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