Built-in self-test and characterization of polar transmitter parameters in the loop-back mode


This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and… (More)

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