Built-in current sensor for IDDQ test

@article{Xue2004BuiltinCS,
  title={Built-in current sensor for IDDQ test},
  author={Bin Xue and D. M. H. Walker},
  journal={Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)},
  year={2004},
  pages={3-9}
}
A practical built-in current sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 muA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a… CONTINUE READING
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